Tencor specializes in precision measurement equipment for the semiconductor industry, offering advanced solutions for surface profilers, defect inspection systems, and metrology tools to ensure quality control and efficiency in semiconductor manufacturing processes. [AI]
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The Tencor 4661 N/A is a semiconductor metrology tool primarily used for measuring thin film thickness on semiconductor wafers. It uses optical interference techniques to make precise measurements of film thickness in the nanometer range. The system is equipped with advanced software for data analysis and reporting. Common failures in the Tencor 4661 N/A may include issues with the optics system such as misalignment or contamination, problems with the data acquisition system, or malfunctioning of the software interface. Regular maintenance and calibration are essential to ensure accurate and reliable measurements.
Industrial Electronic Repair
145 Rockwell Place Ct
Tobaccoville, NC 27050
🚑 Rush repair shipments only — no walk-ins.
Industrial Electronic Repair
931-E S. Main St #204
Kernersville, NC 27284
📦 Mailing Address (for invoices or shipped repairs)
No walk-ins accepted.